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ICCAD-2016 CAD contest in pattern classification for integrated circuit design space analysis and benchmark suite | IEEE Conference Publication | IEEE Xplore

ICCAD-2016 CAD contest in pattern classification for integrated circuit design space analysis and benchmark suite


Abstract:

Layout pattern classification has been utilized in recent years in integrated circuit design towards various goals such as design space analysis, design rule generation, ...Show More

Abstract:

Layout pattern classification has been utilized in recent years in integrated circuit design towards various goals such as design space analysis, design rule generation, and systematic yield optimization. There is a need for open source or academic solutions as very limited vendors are available to provide this functionality. Speed and accuracy are key aspects to target in the solutions. Given a circuit layout and various markers, contestants are asked to provide a reduced set of representative layout clips around these markers. Each such representative clip identifies a class and has an associated set of one or more unique layout markers.
Date of Conference: 07-10 November 2016
Date Added to IEEE Xplore: 23 January 2017
ISBN Information:
Electronic ISSN: 1558-2434
Conference Location: Austin, TX, USA

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