Two Stage Fault Analysis against a Falsification Detection Cipher Minalpher

Regarding security measures, several falsification detection ciphers have been proposed. On the other hand, a thread of fault analysis against cryptographic circuits has been noted. Fault analysis attacks use the characteristics of a circuit that is incorporated into the device, generate a fault, analyze internal information of the circuit from its output, and obtain secret keys. Therefore, to ensure the safety of future IoT devices, fault analysis against falsification detection ciphers must be investigated. The present study proposes a method of fault analysis against Minalpher, a typical falsification detection cipher. Simulation results verify the validity of the proposed method.