Power cycling and surge current tester for SiC power devices

This paper describes the design of a high current tester which is an useful instrument for the SiC power device researchers. The performances, the design and applications examples of the power tester are presented as well. The tester is aimed for reliability tests such as surge current ruggedness and power cycling of SiC diodes. The data acquisition and the waveforms visualization are performed by a standard oscilloscope. With minimum adaptation it could be also used for active controlled semiconductor devices evaluation, such as MOSFETs, JFETs or bipolar transistors (BJT), having similar functions as the high current curve tracers.