Failure and yield analysis of fabrication process of 155 Mbps optical transmitter modules

The failure and yield on the preliminary result of our pioneer fabrication line of 155 Mbps OTMs adopting a modern Si V-groove and FCB techniques have been studied. The yields of LD purge, sub-module assembly, and final assembly were found to be 78%, 95%, and 77% respectively out of total 319 samples. The yield of whole fabrication process has been found to be 57%, where it can be improved to be 70% or higher by replacing the electrical component assembly process with more advanced IC process.