Complete multichannel readout device for THz measurements without lock-in technique

In this work the complete system for THz measurements is presented and briefly described. Proposed solution allows to avoid the most important disadvantages of the lock-in technique without compromising the noise parameters of the developed readout system. The prototype, designed and tested by the authors, supports the pixel line of FET-based THz detectors. The system consists of the hardware part intended to be placed in THz optical setup as well as the measurement application dedicated to use with NI LabVIEW™ environment.