Total Dose Measurement Circuit Design Based on a Voltage Reference Topology

A circuit design for tracking radiation exposure in a CMOS integrated circuit is presented. The design can be scaled and integrated in a variety of CMOS processes. The presented design is based on a voltage reference circuit topology, where changes in voltage due to radiation degradation are amplified in the output. Experimental data from a prototype design using a test chip fabricated in an IBM 180 nm technology and techniques to address limitations of the prototype are presented.