Reliability analysis of a noiseless Code Converter using Quantum Dot Cellular Automata

Quantum Dot Cellular Automata is a novel technology in nanometre scale computing where designed circuits consume lesser amount of area, with lower power consumption and faster switching speed compared to CMOS technology. In this article, a 3-bit Binary to Gray Converter is designed using Quantum Dot Cellular Automata (QCA) and the circuit is verified as a noiseless channel using information theory technology. An Ideal Transfer Matrix (ITM) has been obtained for the circuit and its fault-free nature is verified by calculating 100% efficiency using Shannon-Fano Coding. Fault tolerance of the Binary to Gray Code Converter circuit has been shown by introducing some errors by means of horizontal misalignment, vertical cell displacement and cell omission. Reliability of the fault tolerance circuit is analyzed using Probability Transfer Matrix (PTM).