A fuzzy-based parametric fault diagnosis approach for multiple memristor circuits

The memristor was originally defined as one of the fundamental electrical elements which provided the vacant connection between charge and flux. So far, most of the research has concentrated on the unique features of the individual devices. And the overall behavior of the multiple memristive systems has not been fully studied. Especially, the lack of corresponding fault diagnosis method for complex memristor circuits makes all the existing applications based on the multiple memristor circuits unstable and shaky. In this paper, the composite properties of multiple memristor circuits are further investigated. Then a neotype parametric fault diagnosis approach for memristive networks is presented using the doublet generator, sensitivity method and fuzzy math method, which offers huge benefits in terms of accuracy and time consumption.