Analysis of Single-Event Effects in a Radiation-Hardened Low-Jitter PLL Under Heavy Ion and Pulsed Laser Irradiation

A radiation-hardened low-jitter phase-locked loop (PLL) with a low-mismatch charge pump and a robust voltage-controlled oscillator is designed in a 130 nm PD-SOI process. In order to evaluate the overall response to single-event effects, the accumulated phase jitter has been put forward, which can exclude the inherent noise floor and accumulate all the radiation-induced noise. Then the single-event sensitivity of the proposed PLL is comprehensively analyzed by heavy ion and pulsed laser tests.