Noise parameters of InP-based double heterojunction base-collector self-aligned bipolar transistors

The noise performances of a new base-collector self-aligned technology of double-heterojunction single-finger InGaAs-InP bipolar transistor are investigated at 300 K. Noise parameter variations are studied versus frequency in the 2-18 GHz range, versus collector current and emitter area. A low minimum noise figure F
_min
=0.6 dB is demonstrated at 2 GHz with a 4.8-μm
²
emitter. Variations of F
_min
show a minimum versus collector current. The high cutoff frequencies of the devices limit the increase of F
_min
versus frequency.