Modeling of single event pulse with verilog A: Implementation and application

Radiation effects in ICs have been a hot topic in the reliability area for a long time. In the sub-100nm process technology, the Single-Event Effect (SEE) becomes most critical, and the modeling of Single-Event pulse is an important and challenging issue. In this paper a compact model of Single-Event pulse has been developed with VerilogA behavioral language. This model has also been used for the Radiation-Hardened (RH) circuit validation. A VerilogA compact model could link the device level radiation effects to the circuit level simulation and be efficient for the RH circuit design.