Deep Thermal Investigations on Ag2S Thin Film Along With Electropyroelectric and Photothermal Deflection Techniques

Nowadays, experiments based on possible obtaining of the thermal proprieties of sulphide semiconductor materials as thin films are in progress. Moreover, to reach by calculation, the thermal constants, such as the thermal conductivity, as well as the thermal diffusivity, of such films remains a principal challenge for many of research teams working in optoelectronic and sensitivity devices. This work covers a new theoretical model of the front-detection electropyroelectric configuration, leading to the determination of the thermal parameters of thin films. A normalisation procedure relative to an empty pyroelectric sensor is used to eliminate instrumental factor. Herein, obtained thermal conductivity and the thermal diffusivity of silver sulphide Ag
₂
S are of the order of 0.90 W.
$\text{m}^{-}1\cdot\text{K}^{-1}$
and
$4.52\,\,10^{-7}\text{m}^{2}\cdot\text{s}^{-1}$
, respectively. These values match correctly with the thermal measurements based on well-known photothermal deflection method, which validates our theoretical model.