Permittivity characterization based on Radar Cross measurements

In this paper, classical radar approaches such as the ones recently introduced for chipless RFID identifications are used for nondestructive permittivity characterization of a large variety of materials. A metallic resonant scatterer is placed on the material to be characterized and thanks to the acquisition of its resonant frequency the permittivity can be directly extracted with the use of classical formulas. Simulation and measurement results are presented to show the potential of this characterization technique and to validate the concept.