Experimental analysis of dielectric structures with a two-step electromagnetic imaging method

A novel two-step electromagnetic imaging method, suitable for the analysis of hidden inclusions in dielectric structures, is reported in this paper. In particular, two distinct steps compose the present technique. The first one extracts from the raw data an estimation of the scattered field due to the inclusions, and provides a first qualitative reconstruction of the structure under test. This information is then exploited by the second step, in which a quantitative inexact-Newton inversion approach retrieves a map of the dielectric characteristics of the examined region. Experimental data obtained with a tomograph prototype are used to validate the proposed inversion scheme.