Acquiring Curvature-Dependent Reflectance Function from Translucent Material

Acquiring scattering parameters from real objects is still a challenging work. To obtain the scattering parameters, physics-based analysis is ineffective because huge computational cost is required to simulate subsurface scattering effect accurately. Thus, we focus on Curvature-Dependent Reflectance Function (CDRF), the plausible approximation of the subsurface scattering effect. In this paper, we propose a novel technique to obtain scattering parameters from real objects by revealing the relation between curvature and translucency.