Development of single quantum Hall devices for the resistance standard in NIM

In this paper we report the progress on single quantum Hall devices for the resistance standards in NIM. We use the NIM-made device and the LEP-made device distributed to NIM by BIPM to calibrate a Tinsley 100 Ω transfer resistor using a cryogenic current comparator (CCC) at the filling factor k=2. The deviations of resistance values from the nominal value were -4.4808×10
^-6
±3.5×10
^-9
by NIM-1 and -4.4987×10
^-6
±3.5×10
^-9
by BIPM-2 separately. We assume the relative difference 1.8×10
^-8
is due to the drift of the 100 Ω transfer resistor. More stable resistor will be used in future experiments.