Characterization of the amplitude frequency response of analog-to-digital converters

This paper describes a method for the characterization of the amplitude frequency response of Analog-to-Digital converters at frequencies up to 20 kHz using a true quantum reference calibrated semiconductor based DAC arbitrary waveform generator, developed within the EMPIR project Q-WAVE, jointly founded by the European Union and the participating countries. The procedure that can be used for the characterization of any ADC is applied to the DCV function of a Keysight 3458A digital multimeter. The measurement conditions and the main uncertainty sources are identified and evaluated for complete uncertainty estimation by means of the Monte Carlo Method.