Measurement of the dielectric constants of thin films

Everyone concerned with the measurement of the properties of dielectrics has probably been faced with the problem of measuring the dielectric constants of thin films. “Thin films” are understood to mean varnish, resin or other solid dielectric material not more than a few mils thick. It is the purpose of this paper to discuss some of the methods used, their advantages and limitations, and to suggest an extension of one method which has given very good results in the authors' laboratory.