Predictions of Proton Cross-Section and Sensitive Thickness for Analog Single-Event Transients

In linear devices, the strong impact of configuration on the SET characterization makes them very difficult to predict without using particle accelerators for each application. In this work, based on heavy ion data, we propose to simulate proton cross-sections using gateway tools such as SIMPA, PROFIT or the more recent METIS software we developed within Airbus Group. We review four linear devices and show more physically-motivated predictions for METIS than for the two former approaches. Especially, this engineering tool could be used in a reversed manner to determine the sensitive thickness based on the knowledge of both proton and heavy ion cross-sections.