Combined utilization of analysis instruments: Trace impurity detection for purity xenon

Xenon, a very valuable gas product, is also a critical material used in the fields of industry and scientific research. The purity analysis for xenon thus becomes very important. However, one instrument cannot accomplish the whole analysis because there are several impurities existed in it. In this study, a combined analysis approach was designed. 10 kinds of impurities were detected by GC, GC-MS and CRDS. The final concentrations calculated for all the impurities were lower than 1 µmol/mol, even the level of 0.001 µmol/mol could also be detected. It shows that the methods are very sensitive. The repeatability was evaluated via the relative standard deviations (RSDs), which were 0.11%∼6.29% for the concentration level of 0.01 µmol/mol∼1.41 µmol/mol. This gives an acceptable repeatability for analyzing quite low concentration levels. As described, a combined analysis method with three instruments depending on their own features and capabilities was developed and evaluated, the experimental data supporting that the method are sensitive, simple and acceptable for purity analysis of xenon.