Patents and Microwave Measurements-Nonlinear Transmission Lines [TCC Tidbits]

This column is the first in a series devoted to patents and microwave measurement. Although the patent system is abused and misused, it also offers a path to publish design ideas in addition to journals and conferences. Many times, design ideas and concepts only appear in patents. Therefore, in this column, we will look at how studying patents can inform our knowledge of microwave instrumentation and measurement.