A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing

In this paper, critical path-delay time, and quiescent and transient power-supply current testing have been applied to a 90nm VLIW processor, to predict the remaining lifetime of this processor. The test environment for validation, via implementing an accelerated test has been realized. The resulting delay and current measurement data is presented next, followed by applying a genetic algorithm (GA) to construct a lifetime prediction model for the processor. The calculated remaining lifetime predicted by power-supply testing is close to that of delay-time testing.