Abstract:
This paper presents a study on the effect of Forward Body Biasing on the laser fault sensitivity of a CMOS 90nm microcontroller. Tests were performed on a register of thi...Show MoreMetadata
Abstract:
This paper presents a study on the effect of Forward Body Biasing on the laser fault sensitivity of a CMOS 90nm microcontroller. Tests were performed on a register of this target, under several supply voltage and body bias settings, showing significant laser sensitivity variations. Based on these results, a method which aims at decreasing fault repeatability by using variable supply voltage and body bias settings is proposed. Finally, tests are performed on an implementation of this method on a temporally redundant AES and the results are presented.
Date of Conference: 14-18 March 2016
Date Added to IEEE Xplore: 28 April 2016
Electronic ISBN:978-3-9815-3707-9
Electronic ISSN: 1558-1101
Conference Location: Dresden, Germany