A microprocessor-based dual slope phase meter

A dual-slope phase meter has been designed and tested to investigate its limitations. The design does not require a time standard; it offers good resolution, relative simplicity, low sensitivity to changes of internal circuit parameters, and microprocessor compatibility. The idea is based on a single-slope approach demonstrated by W.T. Davis (1986), but several disadvantages of the system have been eliminated. The main problem with the system, relating to the error due to the finite time of sampling, is discussed.<
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