Determining Conversion Gain and Read Noise Using a Photon-Counting Histogram Method for Deep Sub-Electron Read Noise Image Sensors

A new method for characterizing deep sub-electron read noise image sensors is reported. This method, based on the photon-counting histogram, can provide easy, independent and simultaneous measurements of the quanta exposure, conversion gain, and read noise. This new method provides a more accurate measure of conversion gain and read noise over conventional characterization techniques for image sensors with read noise from 0.15-0.40e- rms.