Local Orientation Variations in YBCO Films on Technical Substrates - A Combined SEM and EBSD Study

Scanning electron microscope imaging and electron backscatter diffraction are applied to 400 nm thick YBCO films grown on Ni-9at.%W and ABAD-YSZ tape. On Ni-9at.%W tape, the orientation of YBCO strongly varies from grain to grain, which is attributed to the different orientations of the underlying substrate grains with regard to the surface normal. On ABAD-YSZ, the structures causing the orientation variations are observed on a micrometer scale only, which is attributed to the granularity of the template. In contrast to Ni-9at.%W where no preferred misorientation axis is notable within single substrate grains, the misorientation of YBCO on the ABAD-YSZ tape is primarily caused by lattice rotations about the sample normal.