EMC/EMI verification methodology for semi-custom design

This paper presents a methodology to predict electromagnetic immunity (EMI) and electromagnetic compatibility (EMC) of semi-custom integrated circuit (IC) design. An automation flow of EMC/EMI verification is developed within the traditional verification method of semi-custom design flow. The bulk current injection (BCI) and direct power injection (DPI) standards for IC electromagnetic susceptibility (EMS) are modeled and implemented to build the verification environment. This method is applied at the verification step of a decimation filter design process. The taped-out chip contains the decimation filter core, and EMS is measured by the BCI method. The comparison between simulation and measurement results are shown to validate and estimate the accuracy of the propose method.