Imaging EQE in CIGS solar cells with high spatial resolution

We use sub-micron scanning photocurrent microscopy to spatially resolve variations in the collection properties of CIGS thin-film solar cells made from a quaternary target. Spectrally dependent photocurrent measurements show remarkable variations in the current collection properties of the grain boundaries and grain cores. We combine EQE maps with Raman and EBSD scans to infer a direct correlation between the electrical and structural properties of the material comprising these polycrystalline devices.