Electron beam characterization techniques for the study of wear in sliding contacts

In this study different methods for studying phenomena of adhesive wear in sliding electrical contacts using electron beam characterization methods within a dual beam workstation are presented. The interface between the substrate and transferred material is complex exhibiting small grain size as well as mechanical deformation. For this purpose, a dual beam workstation is used in order to perform high resolution imaging, structural investigation by electron backscatter diffraction as well as FIB cross sectioning. Only a combination of different imaging techniques with different contrast mechanisms can provide a full understanding of the wear mechanism. During wear a prow is formed on the slider. The structure implies a multi-generation history. The deformation texture resembles a simple shear texture, which is in agreement with the presumed deformation mode. The study mainly gives a guideline for future work in the field of wear in sliding contacts.