Hydrogen Limits for Total Dose and Dose Rate Response in Linear Bipolar Circuits

Soaked-hydrogen irradiations show the H
₂
limits for the total-dose and dose-rate response of bipolar technologies. We use an analytical model to extrapolate experimental observations and generate an H
₂
limits/dose-rate safe-operating-area for various total-dose conditions. Results indicate that 0.1% is the H
₂
limit that can impact device degradation. We also show that the impact is larger for higher dose levels and that extra care needs to be taken when qualifying electronics for specific missions.