Characterization of an enhancement-mode 650-V GaN HFET

GaN heterojunction field-effect transistors (HFETs) in the 600-V class are relatively new in commercial power electronics. The GaN Systems GS66508 is the first commercially available 650-V enhancement-mode device. Static and dynamic testing has been performed across the full current, voltage, and temperature range to enable GaN-based converter design using this new device. A curve tracer was used to measure R
_ds-on
across the full operating temperature range, as well as the self-commutated reverse conduction (i.e. diode-like) behavior. Other static parameters such as transconductance and gate current were also measured. A double pulse test setup was constructed and used to measure switching loss and time at the fastest achievable switching speed, and the subsequent over-voltages due to the fast switching were characterized. Based on these results and analysis, an accurate loss model has been developed for the GS66508 to allow for GaN-based converter design and comparison with other commercially available devices in the 600-V class.