The studies of thin film coatings on the surface of porous silicon

Summary form only given. The complex of surface and subsurface sensitive methods: Auger electron spectroscopy (AES), thermostimulated exoelectron emission (TSEE), mass-spectrometry (MS), ellipsometry and low-frequency dielectric spectroscopy (LFDS) have been applied to investigation of the thin films' coatings, which play a significant role in photo- (PL) and electroluminescence (EL) of por-Si/Si heterostructures.