Abstract:
Noise parameter measurements of six candidate transistors for a Square Kilometer Array (SKA) low-noise amplifier (LNA) are presented. They provide reliable data in the fr...Show MoreMetadata
Abstract:
Noise parameter measurements of six candidate transistors for a Square Kilometer Array (SKA) low-noise amplifier (LNA) are presented. They provide reliable data in the frequency range where some low-noise transistors are inadequately characterized. The results of these measurements inform the design of an LNA for SKA1-Survey Band 2 with measured minimum noise temperature of 21 K.
Date of Conference: 13-17 April 2015
Date Added to IEEE Xplore: 31 August 2015
ISBN Information:
Print ISSN: 2164-3342
Conference Location: Lisbon, Portugal
Contents 