I-V characteristics analysis of YBCO step-edge grain-boundary Josephson junctions

We have measured and analyzed the I-V characteristics of high temperature superconductor (Y-Ba-Cu-O) single step edge Josephson junctions with two different widths versus temperatures down to 3.3K. The junctions showed the resistively shunted junction behavior. And the flux flow behavior was observed in some regions of operation of the 5μm wide junction characteristics which was analyzed according to the estimated penetration depth of the junction.