Using pass/fail limits as a diagnostic tool

This paper addresses the improvement of diagnostic resolution by judicious selection of pass/fail limits. Emphasis is placed on the use of pass/fail limits to discriminate among suspected failures in a known faulty circuit and increase test outcome confidence. Analog circuit simulations serve to illustrate the relationship between failed circuit behavior, pass/fail limits and the associated diagnostic inferences. Interim findings included here were presented at the IEEE International Workshop on System Test and Diagnosis. These findings have been updated to include results from application to a large scale project.