Abstract:
We consider the problem of estimating a parameter θ of a signal s(x; θ) corrupted by noise when only 1-bit precision samples are allowed. We propose and analyze a new est...Show MoreMetadata
Abstract:
We consider the problem of estimating a parameter θ of a signal s(x; θ) corrupted by noise when only 1-bit precision samples are allowed. We propose and analyze a new estimator based on dithered 1-bit samples. Our estimate is consistent and satisfies an asymptotic CLT for a wide class of dither distributions. In particular, uniformly distributed dither leads to only a logarithmic rate loss compared to the case of full precision samples.
Published in: 2006 14th European Signal Processing Conference
Date of Conference: 04-08 September 2006
Date Added to IEEE Xplore: 30 March 2015
Print ISSN: 2219-5491
Conference Location: Florence, Italy
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