The Analysis on Transient-Induced Latch-up in output driver circuit

The occurrence of transient induced latch up (TLU) in output driver circuits is studied. A RS485 transceiver fabricated by a 0.5-μm CMOS process was used for a test chip, and the reason for TLU be induced in output driver circuit is analyzed in this paper, the latch-up and EMMI tests are taken to confirm the reason and position of latch-up.