Tunable sampled-grating DBR lasers with integrated wavelength monitors

We report on the design and development of a wavelength monitor for use with tunable semiconductor lasers. The device is based on two-mode interference in an asymmetrically excited waveguide that is coupled to a Y-branch splitter. The monitoring range of the device is 30 nm. The wavelength monitor is capable of operating over an input power range of 34 dB, and the waveguide detectors do not saturate at photocurrents as high as 1.2 mA. The sensitivity of the monitor is only 1.24 nm for an isolated device, but improves to 0.44 nm when it is integrated on chip with the laser.