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ICCAD-2014 CAD contest in design for manufacturability flow for advanced semiconductor nodes and benchmark suite | IEEE Conference Publication | IEEE Xplore
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ICCAD-2014 CAD contest in design for manufacturability flow for advanced semiconductor nodes and benchmark suite

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Rasit O. Topaloglu
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Abstract:

We introduce the fill optimization problem and benchmarks. We provide two new hotspot definitions, slot line deviation and outliers, both of which pertain to yield. We pr...Show More

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Abstract:

We introduce the fill optimization problem and benchmarks. We provide two new hotspot definitions, slot line deviation and outliers, both of which pertain to yield. We provide the inputs, expected output, as well as objectives and constraints of the problem.
Published in: 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
Date of Conference: 02-06 November 2014
Date Added to IEEE Xplore: 08 January 2015
Electronic ISBN:978-1-4799-6278-5

ISSN Information:

DOI: 10.1109/ICCAD.2014.7001377
Conference Location: San Jose, CA, USA
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