Design and fabrication of a near-field probe for sub-surface microwave imaging

Microwave imaging benefits from information on the internal structure of the object of interest. In this paper, design and fabrication of a near-field microwave scanning probe to investigate the subsurface microwave imaging is discussed. The proposed probe is used for sub-surface imaging of a planar metallic object with arbitrary shape is placed under a paper sheet, and a simple image of this hidden object is captured. The measured results show the proposed sub-surface imaging system is properly working. Then by magnifying, the size of the output images changed to 1000×1000 in order to have better visualization.