Very sensitive measurement method of electron devices current noise

The problem of measuring very low levels of current noise in bipoles (linear or not) is dealt with, and a measurement technique is proposed. This technique allows the measurement of noise power spectra 6-10 dB lower than the equivalent input power spectrum of the amplified necessary to perform the measurement. An improvement of 16-20 dB in the sensitivity is obtained with respect to the one of conventional methods, which, for an acceptable accuracy, require the noise of the bipole under test to be 10 dB larger than the equivalent input one of the amplifier. The present method is based on the accurate measurement of the amplifier transimpedance with respect to the input current noise sources and on the precise evaluation and subtraction of the contribution from all the spurious sources to the total noise. The whole procedure is implemented by means of a dual-channel signal analyzer and almost completely automated. The technique has been tested by using it to measure the power spectra of the noise given by known generators, of the Nyquist noise produced by bipoles made up of resistors and capacitors, and of shot noise in p-n junctions. The experimental results agree very well with theoretical predictions.<
>