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Field and temperature-dependent thin film characterization with a continuous-wave terahertz magneto-spectrometer | IEEE Conference Publication | IEEE Xplore
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Field and temperature-dependent thin film characterization with a continuous-wave terahertz magneto-spectrometer

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D. R. Daughton; R. Higgins; S. Yano
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Abstract:

We report on a non-contact, non-destructive evaluation system which utilizes frequency-domain THz transmission spectroscopy to examine the temperature and magnetic field-...Show More

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Abstract:

We report on a non-contact, non-destructive evaluation system which utilizes frequency-domain THz transmission spectroscopy to examine the temperature and magnetic field-dependent conductivity of thin film on substrate materials.
Published in: 2014 39th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)
Date of Conference: 14-19 September 2014
Date Added to IEEE Xplore: 20 November 2014
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ISSN Information:

DOI: 10.1109/IRMMW-THz.2014.6956227
Conference Location: Tucson, AZ, USA
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