A broadband, on-chip sub/millimeter-wave spectrometer for X-Spec on CCAT

X-Spec is a moderate-resolution (R=400-700), multi-beam survey spectrometer covering the 190-520 GHz band under development for CCAT. It will employ a superconducting lithographically-patterned on-chip spectrometer technology, called SuperSpec. The spectrometer employs a filterbank architecture, and consists of a series of half-wave resonators formed by lithographically-patterned superconducting transmission lines. The signal power admitted by each resonator is detected by a lumped element TiN KID operating at 100-200 MHz. We have fabricated and characterized devices operating at 180-280 GHz, and will provide an update on our latest results.