Measurement and simulation of a CMOS current conveyor negative capacitor for metamaterials

Current conveyors can be used as building blocks for implementing non-Foster circuits such as negative capacitors and negative inductors that are useful in extending bandwidth in metamaterials. In the present paper, measured results are presented for a prototype integrated circuit current conveyor negative capacitor. This circuit has been fabricated in a 0.5 micron CMOS process following previous results. Although CMOS is a desirable technology for circuit implementation, it is accompanied by design challenges of associated parasitic resistance. To investigate these issues, a prototype second generation current conveyor (CCII) is designed and tested in a negative capacitance circuit. In addition, full-wave electromagnetic simulation results are also presented showing the effects of observed resistance on overall metamaterial performance.