Parametric study of PV arc-fault generation methods and analysis of conducted DC spectrum

Many photovoltaic (PV) direct current (DC) arc-fault detectors use the frequency content of the PV system to detect arcs. The spectral content is influenced by the duration and power of the arc, surrounding insulation material geometry and chemistry, and electrode geometry. A parametric analysis was conducted in order to inform the Underwriters Laboratories (UL) 1699B (“Photovoltaic DC Arc-Fault Circuit Protection”) Standards Technical Panel (STP) of improvements to arc-fault generation methods in the certification standard. These recommendations are designed to reduce the complexity of the experimental setup, improve testing repeatability, and quantify the uncertainty of the arc-fault radio frequency (RF) noise generated by different PV arcs in the field. In this investigation, we (a) discuss the differences in establishing and sustaining arc-faults for a number of different test configurations and (b) compare the variability in arc-fault spectral content for each respective test, and analyze the evolution of the RF signature over the duration of the fault; with the ultimate goal of determining the most repeatable, `worst case' tests for adoption by UL.