Abstract:
A new two-step direct extraction algorithm for the intrinsic Gummel-Poon BJT model parameters is presented. In contrast to existing methods, both original and SPICE Gumme...Show MoreMetadata
Abstract:
A new two-step direct extraction algorithm for the intrinsic Gummel-Poon BJT model parameters is presented. In contrast to existing methods, both original and SPICE Gummel-Poon Early effect parameters can be extracted in a coupled and consistent manner. The base current is not involved in the extraction of the Early effect; thus the influence of nonideal base current need not be considered. This ensures proper extraction of the Early voltages, which is a necessary precursor to accurate determination of the remaining parameters. All parameters are determined from linear systems of equations using traditional least square techniques. An analysis of the distribution and number of data points used in the extraction to minimize sensitivity to noise is also performed.
Published in: ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157)
Date of Conference: 23-26 March 1998
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-4348-4