Sensing circuit optimization using different type of transistors for deep submicron STT-RAM

In this paper, we propose an optimal combination of transistor types in the conventional sensing circuit. A sensing margin, which determines the read yield of STT-RAM, is sensitive to the V
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type of several transistors in the sensing circuit. Thus, the optimization of the sensing circuit using different types of transistors is important for designing the sensing circuit in STT-RAM. Using industry compatible 45-nm model parameters, Monte Carlo HSPICE simulation results show that the conventional sensing circuit optimized using different types of transistors achieves read access pass yield enhancement of 10% when compared to the conventional sensing circuit using typical transistors.