Precise measurement of field patterns from a TE02 mode converter using the electro-optic probe scanning system

This paper presents electric field pattern measurements by an excellent field scanning system using a stable electro-optic (EO) field probe. It provides higher resolution and less field distortions than a metal based probe. We simulated a TE
02
gyrotron mode converter by CST Microwave Studio and estimated the mode converter field pattern at 28 GHz. The field-calibrated EO sensor demonstrated up to 60 dB of Signal to Noise Ratio (SNR). Finally, we compared both results using the Cross Correlation Function (CCF). The schematic of the EO probe scanning system and estimation results are provided.