Analysis of the transient radiation damage effects on electronics using irradiation experiment and model simulation

In this study, it was attempted to construct damage assessment model which could systematically analyze and predict the effects on the semiconductor devices. At first, the PIN diode was designed and manufactured for both the simulation and radiation test. After that the radiation test were performed to it with Gamma-ray. Next, after inputting the pulse model similar to that used in the measurement into 3D model PIN diode with the same parameters of the process design, the behavior of the instantaneous charges which were generated inside the devices were analyzed and the output current value was simulated. The results obtained from the two processes showed the similar characteristics.