Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation

Recently (IEEE Trans. Nucl. Sci., Vol. 60, No. 3, pp. 1876-1911, 2013), Reed published an anthology of contributions from different research groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event. The Tool suIte for rAdiation Reliability Assessment (TIARA) simulation platform and its development by STMicroelectronics and Aix-Marseille University is described in this paper as a complement to this anthology.